Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

Research output: Contribution to journal › Article › Research › peer-review

Access to Document

@article{aa2a74056f97499484a52caa9968f173,

title = "Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube",

author = "Ghanem, \{T K\} and Williams, \{Ellen D\} and Michael Fuhrer",

year = "2011",

doi = "10.1063/1.3626811",

language = "English",

volume = "110",

pages = "1 -- 7",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

AU - Ghanem, T K

AU - Williams, Ellen D

AU - Fuhrer, Michael

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3626811

DO - 10.1063/1.3626811

M3 - Article

SN - 0021-8979

VL - 110

SP - 1

EP - 7

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

ER -