Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

T K Ghanem, Ellen D Williams, Michael Fuhrer

Research output: Contribution to journalArticleResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)1 - 7
Number of pages7
JournalJournal of Applied Physics
Volume110
Issue number5
DOIs
Publication statusPublished - 2011
Externally publishedYes

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