Characterisation of speckle-based X-ray phase-contrast imaging

M. Zdora, P. Thibault, C. Rau, I. Zanette

Research output: Contribution to journalConference articleResearchpeer-review

2 Citations (Scopus)

Abstract

We present a study on the influence of different scan and reconstruction parameters on the image quality of the differential phase signals obtained from speckle-based X-ray phase-contrast imaging measurements in single-shot as well as 2D and 1D speckle-stepping modes. In particular, the effects of the analysis window size and the number of diffuser steps on the spatial resolution and signal sensitivity of images of a phantom sample are investigated and discussed. It is shown that the trade-off between spatial resolution, scan time and simplicity of the setup has to carefully be addressed for each specific experiment.

Original languageEnglish
Article number012024
Number of pages5
JournalJournal of Physics: Conference Series
Volume849
Issue number1
DOIs
Publication statusPublished - 14 Jun 2017
Externally publishedYes
EventInternational Conference on X-ray Microscopy (XRM) 2016 - Oxford University, Oxford, United Kingdom
Duration: 15 Aug 201619 Aug 2016
Conference number: 13th
https://iopscience.iop.org/issue/1742-6596/849/1

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