Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-rayscattering

Daniele Pelliccia, Andrei Yurievich Nikulin, Nigel Kirby, James Hester

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	549 - 554
Number of pages	6
Journal	International Journal of Nanotechnology
Volume	11
Issue number	5
DOIs	https://doi.org/10.1504/IJNT.2014.060578
Publication status	Published - 2014

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title = "Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-rayscattering",

author = "Daniele Pelliccia and Nikulin, {Andrei Yurievich} and Nigel Kirby and James Hester",

year = "2014",

doi = "10.1504/IJNT.2014.060578",

language = "English",

volume = "11",

pages = "549 -- 554",

journal = "International Journal of Nanotechnology",

issn = "1475-7435",

publisher = "Inderscience Publishers",

number = "5",

}

TY - JOUR

T1 - Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-rayscattering

AU - Pelliccia, Daniele

AU - Nikulin, Andrei Yurievich

AU - Kirby, Nigel

AU - Hester, James

PY - 2014

Y1 - 2014

U2 - 10.1504/IJNT.2014.060578

DO - 10.1504/IJNT.2014.060578

M3 - Article

SN - 1475-7435

VL - 11

SP - 549

EP - 554

JO - International Journal of Nanotechnology

JF - International Journal of Nanotechnology

IS - 5

ER -