Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM

Christopher John Rossouw, Christian Dwyer, Hadas Boon, Joanne Etheridge

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)216 - 223
Number of pages8
JournalUltramicroscopy
Volume136
DOIs
Publication statusPublished - 2014

Cite this

Rossouw, Christopher John ; Dwyer, Christian ; Boon, Hadas ; Etheridge, Joanne. / Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM. In: Ultramicroscopy. 2014 ; Vol. 136. pp. 216 - 223.
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Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM. / Rossouw, Christopher John; Dwyer, Christian; Boon, Hadas; Etheridge, Joanne.

In: Ultramicroscopy, Vol. 136, 2014, p. 216 - 223.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM

AU - Rossouw, Christopher John

AU - Dwyer, Christian

AU - Boon, Hadas

AU - Etheridge, Joanne

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