Celebrating 40 years of panel data analysis: past, present and future

Vasilis Sarafidis; Tom Wansbeek

doi:10.1016/j.jeconom.2020.06.001

Celebrating 40 years of panel data analysis: past, present and future

Vasilis Sarafidis, Tom Wansbeek

Econometrics & Business Statistics

Research output: Contribution to journal › Editorial › Other › peer-review

21 Citations (Scopus)

Abstract

The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field.

Original language	English
Pages (from-to)	215-226
Number of pages	12
Journal	Journal of Econometrics
Volume	220
Issue number	2
DOIs	https://doi.org/10.1016/j.jeconom.2020.06.001
Publication status	Published - Feb 2021

Keywords

Aggregation bias
Common factor models
Cross-sectional dependence
Dynamic relationships
Incidental parameter problem
Multi-dimensional data
Multi-level data
Nonlinear models
Omitted variables
Panel data analysis
Temporal effects
Unobserved heterogeneity

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10.1016/j.jeconom.2020.06.001

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abstract = "The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field.",

keywords = "Aggregation bias, Common factor models, Cross-sectional dependence, Dynamic relationships, Incidental parameter problem, Multi-dimensional data, Multi-level data, Nonlinear models, Omitted variables, Panel data analysis, Temporal effects, Unobserved heterogeneity",

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AB - The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field.

KW - Aggregation bias

KW - Common factor models

KW - Cross-sectional dependence

KW - Dynamic relationships

KW - Incidental parameter problem

KW - Multi-dimensional data

KW - Multi-level data

KW - Nonlinear models

KW - Omitted variables

KW - Panel data analysis

KW - Temporal effects

KW - Unobserved heterogeneity

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SN - 0304-4076

VL - 220

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EP - 226

JO - Journal of Econometrics

JF - Journal of Econometrics

IS - 2

ER -

Celebrating 40 years of panel data analysis: past, present and future

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Keywords

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Micro-Panel Data with Nonlinear Error Components: Advances and Applications

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Celebrating 40 years of panel data analysis: past, present and future

Abstract

Keywords

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Micro-Panel Data with Nonlinear Error Components: Advances and Applications

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