Abstract
The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.
| Original language | English |
|---|---|
| Pages (from-to) | 35-43 |
| Number of pages | 9 |
| Journal | Materials Forum |
| Volume | 15 |
| Issue number | 1 |
| Publication status | Published - 1 Jan 1991 |
| Externally published | Yes |
Cite this
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Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD. / Pain, G. N.; Russo, S. P.; Elliman, R. G.; Wielunski, L. S.; Gao, D.; Glanvill, S. R.; Rossouw, C. J.; Stevenson, A. W.; Rowe, R. S.; Deacon, G. B.; Dickson, R. S.; West, B. O.
In: Materials Forum, Vol. 15, No. 1, 01.01.1991, p. 35-43.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD
AU - Pain, G. N.
AU - Russo, S. P.
AU - Elliman, R. G.
AU - Wielunski, L. S.
AU - Gao, D.
AU - Glanvill, S. R.
AU - Rossouw, C. J.
AU - Stevenson, A. W.
AU - Rowe, R. S.
AU - Deacon, G. B.
AU - Dickson, R. S.
AU - West, B. O.
PY - 1991/1/1
Y1 - 1991/1/1
N2 - The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.
AB - The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.
UR - http://www.scopus.com/inward/record.url?scp=0025919837&partnerID=8YFLogxK
M3 - Article
VL - 15
SP - 35
EP - 43
JO - Materials Forum
JF - Materials Forum
SN - 1447-6738
IS - 1
ER -