Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD

G. N. Pain, S. P. Russo, R. G. Elliman, L. S. Wielunski, D. Gao, S. R. Glanvill, C. J. Rossouw, A. W. Stevenson, R. S. Rowe, G. B. Deacon, R. S. Dickson, B. O. West

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Abstract

The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.

Original languageEnglish
Pages (from-to)35-43
Number of pages9
JournalMaterials Forum
Volume15
Issue number1
Publication statusPublished - 1 Jan 1991
Externally publishedYes

Cite this

Pain, G. N., Russo, S. P., Elliman, R. G., Wielunski, L. S., Gao, D., Glanvill, S. R., ... West, B. O. (1991). Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD. Materials Forum, 15(1), 35-43.
Pain, G. N. ; Russo, S. P. ; Elliman, R. G. ; Wielunski, L. S. ; Gao, D. ; Glanvill, S. R. ; Rossouw, C. J. ; Stevenson, A. W. ; Rowe, R. S. ; Deacon, G. B. ; Dickson, R. S. ; West, B. O. / Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD. In: Materials Forum. 1991 ; Vol. 15, No. 1. pp. 35-43.
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title = "Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD",
abstract = "The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.",
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Pain, GN, Russo, SP, Elliman, RG, Wielunski, LS, Gao, D, Glanvill, SR, Rossouw, CJ, Stevenson, AW, Rowe, RS, Deacon, GB, Dickson, RS & West, BO 1991, 'Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD', Materials Forum, vol. 15, no. 1, pp. 35-43.

Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD. / Pain, G. N.; Russo, S. P.; Elliman, R. G.; Wielunski, L. S.; Gao, D.; Glanvill, S. R.; Rossouw, C. J.; Stevenson, A. W.; Rowe, R. S.; Deacon, G. B.; Dickson, R. S.; West, B. O.

In: Materials Forum, Vol. 15, No. 1, 01.01.1991, p. 35-43.

Research output: Contribution to journalArticleResearchpeer-review

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AU - Pain, G. N.

AU - Russo, S. P.

AU - Elliman, R. G.

AU - Wielunski, L. S.

AU - Gao, D.

AU - Glanvill, S. R.

AU - Rossouw, C. J.

AU - Stevenson, A. W.

AU - Rowe, R. S.

AU - Deacon, G. B.

AU - Dickson, R. S.

AU - West, B. O.

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AB - The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.

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Pain GN, Russo SP, Elliman RG, Wielunski LS, Gao D, Glanvill SR et al. Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD. Materials Forum. 1991 Jan 1;15(1):35-43.