In this study we investigate the carrier relaxation dynamics in p-type doped InGaAs/GaAs quantum dots using time-integrated and time-resolved photoluminescence. The experiment shows that while a strong phonon bottleneck is observed in the undoped samples, with a 680 ps rise time of the photoluminescence intensity, the intra-dot relaxation time (31 ps) of the p-type doped samples is reduced significantly due to scattering of photo-excited electrons with the doping-induced holes.
|Number of pages||3|
|Journal||Journal of Materials Science: Materials in Electronics|
|Issue number||SUPPL. 1|
|Publication status||Published - 1 Oct 2007|