| Original language | English |
|---|---|
| Pages (from-to) | 969 - 973 |
| Number of pages | 5 |
| Journal | European Journal of Physics |
| Volume | 27 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2006 |
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Cantilever deflection profile in scanning probe microscopy
- Tuck Wah Ng
- , S Thirunavukkarasu
Research output: Contribution to journal › Article › Research › peer-review