TY - JOUR
T1 - Calibration and data extraction in nonoptimized Mueller matrix polarimeters
AU - Rodríguez-Nuñez, Omar
AU - López-Téllez, Juan Manuel
AU - Rodríguez-Herrera, Oscar G.
AU - Bruce, Neil C.
N1 - Funding Information:
Dirección General de Asuntos del Personal Académico, Universidad Nacional Autónoma de México (DGAPA, UNAM) (PAPIIT IT100114, PAPIIT IT100417). O.R.N. and J.M.L.T. acknowledge doctoral grants from CONACyT México.
Publisher Copyright:
© 2017 Optical Society of America.
PY - 2017/5/20
Y1 - 2017/5/20
N2 - We present a method for calibration and data extraction for a nonoptimized Mueller matrix polarimeter. The advantage of this type of method is a reduction in measurement time for multiwavelength systems or in systems with slow response times. The calibration process requires the measurement of four known polarization devices. Here we use free-space transmission, a horizontal and a vertical linear polarizer, and a quarter-wave retarder with its fast axis at 30° to the horizontal. Experimental measurements of rotating quarter-wave and half-wave retarders show that accurate results can be obtained with the proposed method.
AB - We present a method for calibration and data extraction for a nonoptimized Mueller matrix polarimeter. The advantage of this type of method is a reduction in measurement time for multiwavelength systems or in systems with slow response times. The calibration process requires the measurement of four known polarization devices. Here we use free-space transmission, a horizontal and a vertical linear polarizer, and a quarter-wave retarder with its fast axis at 30° to the horizontal. Experimental measurements of rotating quarter-wave and half-wave retarders show that accurate results can be obtained with the proposed method.
UR - http://www.scopus.com/inward/record.url?scp=85019933617&partnerID=8YFLogxK
U2 - 10.1364/AO.56.004398
DO - 10.1364/AO.56.004398
M3 - Article
C2 - 29047869
AN - SCOPUS:85019933617
SN - 1559-128X
VL - 56
SP - 4398
EP - 4405
JO - Applied Optics
JF - Applied Optics
IS - 15
ER -