Calculating x-ray diffraction from multilayer lateral crystal structures with arbitrary shapes and composition profiles

Vasily I Punegov, A I Maksimov, Sergey I Kolosov, Konstantin Mikhailovitch Pavlov

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    Abstract

    A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape and arbitrary depth-composition profile has been developed within the framework of the kinematic approximation. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-axis diffractometry scheme are presented.
    Original languageEnglish
    Pages (from-to)125 - 127
    Number of pages3
    JournalTechnical Physics Letters
    Volume33
    Issue number2
    Publication statusPublished - 2007

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