Blemish detection in citrus fruits

Abdul Malik Khan, Andrew Peter Paplinski

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the SPIT-IEEE Colloquium and International Conference
    EditorsPrachi Gharpure
    Place of PublicationNew York NY USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages203 - 211
    Number of pages9
    Volume1
    Publication statusPublished - 2008
    EventSPIT-IEEE Colloquium and International Conference - Mumbai India, New York NY USA
    Duration: 1 Jan 2008 → …

    Conference

    ConferenceSPIT-IEEE Colloquium and International Conference
    CityNew York NY USA
    Period1/01/08 → …

    Cite this

    Khan, A. M., & Paplinski, A. P. (2008). Blemish detection in citrus fruits. In P. Gharpure (Ed.), Proceedings of the SPIT-IEEE Colloquium and International Conference (Vol. 1, pp. 203 - 211). New York NY USA: IEEE, Institute of Electrical and Electronics Engineers.
    Khan, Abdul Malik ; Paplinski, Andrew Peter. / Blemish detection in citrus fruits. Proceedings of the SPIT-IEEE Colloquium and International Conference. editor / Prachi Gharpure. Vol. 1 New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2008. pp. 203 - 211
    @inproceedings{810ad37ac8a94e40ac2cac17f284d746,
    title = "Blemish detection in citrus fruits",
    author = "Khan, {Abdul Malik} and Paplinski, {Andrew Peter}",
    year = "2008",
    language = "English",
    volume = "1",
    pages = "203 -- 211",
    editor = "Prachi Gharpure",
    booktitle = "Proceedings of the SPIT-IEEE Colloquium and International Conference",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States of America",

    }

    Khan, AM & Paplinski, AP 2008, Blemish detection in citrus fruits. in P Gharpure (ed.), Proceedings of the SPIT-IEEE Colloquium and International Conference. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, New York NY USA, pp. 203 - 211, SPIT-IEEE Colloquium and International Conference, New York NY USA, 1/01/08.

    Blemish detection in citrus fruits. / Khan, Abdul Malik; Paplinski, Andrew Peter.

    Proceedings of the SPIT-IEEE Colloquium and International Conference. ed. / Prachi Gharpure. Vol. 1 New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2008. p. 203 - 211.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    TY - GEN

    T1 - Blemish detection in citrus fruits

    AU - Khan, Abdul Malik

    AU - Paplinski, Andrew Peter

    PY - 2008

    Y1 - 2008

    UR - http://www.ieee-spce.org/colloquium/proceedings/proceedings.html

    M3 - Conference Paper

    VL - 1

    SP - 203

    EP - 211

    BT - Proceedings of the SPIT-IEEE Colloquium and International Conference

    A2 - Gharpure, Prachi

    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - New York NY USA

    ER -

    Khan AM, Paplinski AP. Blemish detection in citrus fruits. In Gharpure P, editor, Proceedings of the SPIT-IEEE Colloquium and International Conference. Vol. 1. New York NY USA: IEEE, Institute of Electrical and Electronics Engineers. 2008. p. 203 - 211