Blemish detection in citrus fruits

Abdul Malik Khan, Andrew Peter Paplinski

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the SPIT-IEEE Colloquium and International Conference
    EditorsPrachi Gharpure
    Place of PublicationNew York NY USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages203 - 211
    Number of pages9
    Volume1
    Publication statusPublished - 2008
    EventSPIT-IEEE Colloquium and International Conference - Mumbai India, New York NY USA
    Duration: 1 Jan 2008 → …

    Conference

    ConferenceSPIT-IEEE Colloquium and International Conference
    CityNew York NY USA
    Period1/01/08 → …

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