Automatic yield management for semiconductor production test

Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Kwang Joo Sim, Bryan Cheah, Serge Demidenko

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 2011 Sixth IEEE International Symposium on Electonic Design, Test and Application, DELTA 2011
    EditorsGourab Sen Gupta, Donald Bailey, Serge Demidenko, Adam Osseiran, Michel Renovell
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages254 - 258
    Number of pages5
    ISBN (Print)9780769543062
    DOIs
    Publication statusPublished - 2011
    EventIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011 - Queenstown New Zealand, USA
    Duration: 1 Jan 2011 → …

    Conference

    ConferenceIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011
    CityUSA
    Period1/01/11 → …

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