Automated stress testing of Windows Mobile GUI applications

Nizam Abdallah; Sitalakshmi Ramakrishnan

Automated stress testing of Windows Mobile GUI applications

Nizam Abdallah, Sitalakshmi Ramakrishnan

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Supplemental Proceedings of the 20th International Symposium on Software Reliability Engineering (ISSRE 2009)
Editors	Andrew Podgurski, Pankaj Jalote
Place of Publication	Los Alamitos CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1 - 5
Number of pages	5
ISBN (Print)	0972655867
Publication status	Published - 2009
Event	International Symposium on Software Reliability Engineering 2009 - Mysuru Karnataka, India Duration: 16 Nov 2009 → 19 Nov 2009 Conference number: 20th

Conference

Conference	International Symposium on Software Reliability Engineering 2009
Abbreviated title	ISSRE 2009
Country/Territory	India
City	Mysuru Karnataka
Period	16/11/09 → 19/11/09

Cite this

@inproceedings{6c951fcf45174991830e5f0d586593b1,

title = "Automated stress testing of Windows Mobile GUI applications",

author = "Nizam Abdallah and Sitalakshmi Ramakrishnan",

year = "2009",

language = "English",

isbn = "0972655867",

pages = "1 -- 5",

editor = "Andrew Podgurski and Pankaj Jalote",

booktitle = "Supplemental Proceedings of the 20th International Symposium on Software Reliability Engineering (ISSRE 2009)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "International Symposium on Software Reliability Engineering 2009, ISSRE 2009 ; Conference date: 16-11-2009 Through 19-11-2009",

}

Abdallah, N & Ramakrishnan, S 2009, Automated stress testing of Windows Mobile GUI applications. in A Podgurski & P Jalote (eds), Supplemental Proceedings of the 20th International Symposium on Software Reliability Engineering (ISSRE 2009). IEEE, Institute of Electrical and Electronics Engineers, Los Alamitos CA USA, pp. 1 - 5, International Symposium on Software Reliability Engineering 2009, Mysuru Karnataka, India, 16/11/09.

Automated stress testing of Windows Mobile GUI applications. / Abdallah, Nizam; Ramakrishnan, Sitalakshmi.
Supplemental Proceedings of the 20th International Symposium on Software Reliability Engineering (ISSRE 2009). ed. / Andrew Podgurski; Pankaj Jalote. Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 1 - 5.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Automated stress testing of Windows Mobile GUI applications

AU - Abdallah, Nizam

AU - Ramakrishnan, Sitalakshmi

N1 - Conference code: 20th

PY - 2009

Y1 - 2009

M3 - Conference Paper

SN - 0972655867

SP - 1

EP - 5

BT - Supplemental Proceedings of the 20th International Symposium on Software Reliability Engineering (ISSRE 2009)

A2 - Podgurski, Andrew

A2 - Jalote, Pankaj

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Los Alamitos CA USA

T2 - International Symposium on Software Reliability Engineering 2009

Y2 - 16 November 2009 through 19 November 2009

ER -