Abstract
Phase retrieval is widely used in phase contrast microscopy. Here we present an autofocus algorithm that allows the phase of the exit wave function, from a single-material object, to be reconstructed at medium resolution from a single phase contrast image without any a priori knowledge of the imaging system or object. The algorithm is demonstrated on coherent out-of-focus electron micrographs of 30nm latex sphere calibration standards, giving
Original language | English |
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Pages (from-to) | 1878 - 1880 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 36 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2011 |
Equipment
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Centre for Electron Microscopy (MCEM)
Peter Miller (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)Facility/equipment: Facility