Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture

Chathuranga Harshanath Widanapathirana, Jonathan Li, Milosh Vladimir Ivanovich, Paul Gerard Fitzpatrick, Yasar Ahmet Sekercioglu

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013)
EditorsJens Tolle
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages557 - 564
Number of pages8
ISBN (Print)9781479905362
DOIs
Publication statusPublished - 2013
EventIEEE Conference on Local Computer Networks 2013 - Citigate Central, Sydney, Australia
Duration: 21 Oct 201324 Oct 2013
Conference number: 38th
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6745315 (IEEE Conference Proceedings)

Conference

ConferenceIEEE Conference on Local Computer Networks 2013
Abbreviated titleLCN 2013
CountryAustralia
CitySydney
Period21/10/1324/10/13
Internet address

Cite this

Widanapathirana, C. H., Li, J., Ivanovich, M. V., Fitzpatrick, P. G., & Sekercioglu, Y. A. (2013). Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture. In J. Tolle (Ed.), Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013) (pp. 557 - 564). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/LCN.2013.6761298
Widanapathirana, Chathuranga Harshanath ; Li, Jonathan ; Ivanovich, Milosh Vladimir ; Fitzpatrick, Paul Gerard ; Sekercioglu, Yasar Ahmet. / Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture. Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013). editor / Jens Tolle. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. pp. 557 - 564
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title = "Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture",
author = "Widanapathirana, {Chathuranga Harshanath} and Jonathan Li and Ivanovich, {Milosh Vladimir} and Fitzpatrick, {Paul Gerard} and Sekercioglu, {Yasar Ahmet}",
year = "2013",
doi = "10.1109/LCN.2013.6761298",
language = "English",
isbn = "9781479905362",
pages = "557 -- 564",
editor = "Jens Tolle",
booktitle = "Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013)",
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Widanapathirana, CH, Li, J, Ivanovich, MV, Fitzpatrick, PG & Sekercioglu, YA 2013, Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture. in J Tolle (ed.), Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013). IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 557 - 564, IEEE Conference on Local Computer Networks 2013, Sydney, Australia, 21/10/13. https://doi.org/10.1109/LCN.2013.6761298

Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture. / Widanapathirana, Chathuranga Harshanath; Li, Jonathan; Ivanovich, Milosh Vladimir; Fitzpatrick, Paul Gerard; Sekercioglu, Yasar Ahmet.

Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013). ed. / Jens Tolle. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. p. 557 - 564.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

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Widanapathirana CH, Li J, Ivanovich MV, Fitzpatrick PG, Sekercioglu YA. Automated diagnosis of known and unknown soft-failure in user devices using transformed signatures and single classifier architecture. In Tolle J, editor, Proceedings of the 38th Annual IEEE Conference on Local Computer Networks (LCN 2013). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2013. p. 557 - 564 https://doi.org/10.1109/LCN.2013.6761298