Attenuation length measurements in lead arachidate Langmuir Blodgett films

Murali Sastry; P. Ganguly; S. Badrinarayanan; A. B. Mandale; S. R. Sainkar; D. V. Paranjape; K. R. Patil; S. K. Chaudhary

doi:10.1063/1.349788

Attenuation length measurements in lead arachidate Langmuir Blodgett films

Murali Sastry, P. Ganguly, S. Badrinarayanan, A. B. Mandale, S. R. Sainkar, D. V. Paranjape, K. R. Patil, S. K. Chaudhary

Research output: Contribution to journal › Article › Research › peer-review

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Abstract

In this paper the attenuation length measurements in lead arachidate [(C₁₉H₃₉COO)₂Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f_7/2, O 1s and Cu 2p_3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.

Original language	English
Pages (from-to)	7073-7077
Number of pages	5
Journal	Journal of Applied Physics
Volume	70
Issue number	11
DOIs	https://doi.org/10.1063/1.349788
Publication status	Published - 1991
Externally published	Yes

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abstract = "In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.",

author = "Murali Sastry and P. Ganguly and S. Badrinarayanan and Mandale, \{A. B.\} and Sainkar, \{S. R.\} and Paranjape, \{D. V.\} and Patil, \{K. R.\} and Chaudhary, \{S. K.\}",

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AU - Sastry, Murali

AU - Ganguly, P.

AU - Badrinarayanan, S.

AU - Mandale, A. B.

AU - Sainkar, S. R.

AU - Paranjape, D. V.

AU - Patil, K. R.

AU - Chaudhary, S. K.

PY - 1991

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N2 - In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.

AB - In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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ER -

Attenuation length measurements in lead arachidate Langmuir Blodgett films

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