Attenuation length measurements in lead arachidate Langmuir Blodgett films

Murali Sastry, P. Ganguly, S. Badrinarayanan, A. B. Mandale, S. R. Sainkar, D. V. Paranjape, K. R. Patil, S. K. Chaudhary

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Abstract

In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.

Original languageEnglish
Pages (from-to)7073-7077
Number of pages5
JournalJournal of Applied Physics
Volume70
Issue number11
DOIs
Publication statusPublished - 1991
Externally publishedYes

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