Atomic - scale study of model CdTe grain boundaries

Tadas Paulauskas, Fatih Sen, Cyrus Sun, Edward Barnard, Moon Kim, Sivalingam Sivananthan, Maria Chan, Robert Klie

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

Abstract

Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ∼21.5% power conversion efficiency and hence are still ∼10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer-bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.

Original languageEnglish
Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC 2016)
Subtitle of host publicationPortland, Oregon, USA, 5-10 June 2016 [Proceedings]
Place of PublicationPiscataway, NJ
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages3664-3666
Number of pages3
ISBN (Electronic)9781509027248
ISBN (Print)9781509027255
DOIs
Publication statusPublished - 18 Nov 2016
Externally publishedYes
EventIEEE Photovoltaic Specialists Conference 2016 - Portland, United States of America
Duration: 5 Jun 201610 Jun 2016
Conference number: 43rd

Conference

ConferenceIEEE Photovoltaic Specialists Conference 2016
Abbreviated titlePVSC 2016
CountryUnited States of America
CityPortland
Period5/06/1610/06/16

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