Atomic-resolution scanning transmission electron microscopy with segmented annular all field detector

N. Shibata, S.D. Findlay, Y. Ikuhara

Research output: Contribution to conferenceAbstract

Original languageEnglish
Pages64-65
Number of pages2
DOIs
Publication statusPublished - 1 Aug 2014
EventMicroscopy and Microanalysis 2014 - Connecticut Convention Center, Hartford CT, United States of America
Duration: 3 Aug 20147 Aug 2014
http://www.microscopy.org/MandM/2014/index.cfm

Conference

ConferenceMicroscopy and Microanalysis 2014
Abbreviated titleMandM 2014
CountryUnited States of America
CityHartford CT
Period3/08/147/08/14
Internet address

Cite this

Shibata, N., Findlay, S. D., & Ikuhara, Y. (2014). Atomic-resolution scanning transmission electron microscopy with segmented annular all field detector. 64-65. Abstract from Microscopy and Microanalysis 2014, Hartford CT, United States of America. https://doi.org/10.1017/S1431927614002049