Atomic resolution electron microscopy in a magnetic field free environment

Naoya Shibata, Yuji Kohno, A Nakamura, S Morishita, Takehito Seki, A Kumamoto, Hidetaka Sawada, Takeru Matsumoto, Scott Findlay, Yuichi Ikuhara

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4 Citations (Scopus)

Abstract

Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

Original languageEnglish
Article number2308
Number of pages5
JournalNature Communications
Volume10
Issue number1
DOIs
Publication statusPublished - 1 Dec 2019

Cite this

Shibata, N., Kohno, Y., Nakamura, A., Morishita, S., Seki, T., Kumamoto, A., Sawada, H., Matsumoto, T., Findlay, S., & Ikuhara, Y. (2019). Atomic resolution electron microscopy in a magnetic field free environment. Nature Communications, 10(1), [2308]. https://doi.org/10.1038/s41467-019-10281-2