Atomic resolution electron microscopy in a magnetic field free environment

Naoya Shibata, Yuji Kohno, A Nakamura, S Morishita, Takehito Seki, A Kumamoto, Hidetaka Sawada, Takeru Matsumoto, Scott Findlay, Yuichi Ikuhara

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)

Abstract

Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

Original languageEnglish
Article number2308
Number of pages5
JournalNature Communications
Volume10
Issue number1
DOIs
Publication statusPublished - 1 Dec 2019

Cite this

Shibata, N., Kohno, Y., Nakamura, A., Morishita, S., Seki, T., Kumamoto, A., ... Ikuhara, Y. (2019). Atomic resolution electron microscopy in a magnetic field free environment. Nature Communications, 10(1), [2308]. https://doi.org/10.1038/s41467-019-10281-2
Shibata, Naoya ; Kohno, Yuji ; Nakamura, A ; Morishita, S ; Seki, Takehito ; Kumamoto, A ; Sawada, Hidetaka ; Matsumoto, Takeru ; Findlay, Scott ; Ikuhara, Yuichi. / Atomic resolution electron microscopy in a magnetic field free environment. In: Nature Communications. 2019 ; Vol. 10, No. 1.
@article{5b0e7ca343e4485895a27074113dee15,
title = "Atomic resolution electron microscopy in a magnetic field free environment",
abstract = "Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-{\AA} spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.",
author = "Naoya Shibata and Yuji Kohno and A Nakamura and S Morishita and Takehito Seki and A Kumamoto and Hidetaka Sawada and Takeru Matsumoto and Scott Findlay and Yuichi Ikuhara",
year = "2019",
month = "12",
day = "1",
doi = "10.1038/s41467-019-10281-2",
language = "English",
volume = "10",
journal = "Nature Communications",
issn = "2041-1723",
publisher = "Nature Publishing Group",
number = "1",

}

Shibata, N, Kohno, Y, Nakamura, A, Morishita, S, Seki, T, Kumamoto, A, Sawada, H, Matsumoto, T, Findlay, S & Ikuhara, Y 2019, 'Atomic resolution electron microscopy in a magnetic field free environment', Nature Communications, vol. 10, no. 1, 2308. https://doi.org/10.1038/s41467-019-10281-2

Atomic resolution electron microscopy in a magnetic field free environment. / Shibata, Naoya; Kohno, Yuji; Nakamura, A; Morishita, S; Seki, Takehito; Kumamoto, A; Sawada, Hidetaka; Matsumoto, Takeru; Findlay, Scott; Ikuhara, Yuichi.

In: Nature Communications, Vol. 10, No. 1, 2308, 01.12.2019.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Atomic resolution electron microscopy in a magnetic field free environment

AU - Shibata, Naoya

AU - Kohno, Yuji

AU - Nakamura, A

AU - Morishita, S

AU - Seki, Takehito

AU - Kumamoto, A

AU - Sawada, Hidetaka

AU - Matsumoto, Takeru

AU - Findlay, Scott

AU - Ikuhara, Yuichi

PY - 2019/12/1

Y1 - 2019/12/1

N2 - Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

AB - Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

UR - http://www.scopus.com/inward/record.url?scp=85066930591&partnerID=8YFLogxK

U2 - 10.1038/s41467-019-10281-2

DO - 10.1038/s41467-019-10281-2

M3 - Article

VL - 10

JO - Nature Communications

JF - Nature Communications

SN - 2041-1723

IS - 1

M1 - 2308

ER -

Shibata N, Kohno Y, Nakamura A, Morishita S, Seki T, Kumamoto A et al. Atomic resolution electron microscopy in a magnetic field free environment. Nature Communications. 2019 Dec 1;10(1). 2308. https://doi.org/10.1038/s41467-019-10281-2