Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron Microscopy

L. J. Allen, S. D. Findlay, A. R. Lupini, M. P. Oxley, S. J. Pennycook

    Research output: Contribution to journalArticleResearchpeer-review

    88 Citations (Scopus)


    The “delocalization” of inelastic scattering is an important issue for the ultimate spatial resolution of innershell spectroscopy in the electron microscope. It is demonstrated in a nonlocal model for electron energy loss spectroscopy (EELS) that delocalization of scanning transmission electron microscopy (STEM) images for single, isolated atoms is primarily determined by the width of the probe, even for light atoms. We present experimental data and theoretical simulations for Ti [Formula presented]-shell EELS in a [100] [Formula presented] crystal showing that, in this case, delocalization is not significantly increased by dynamical propagation. Issues relating to the use of aberration correctors in the STEM geometry are discussed.

    Original languageEnglish
    JournalPhysical Review Letters
    Issue number10
    Publication statusPublished - 5 Sep 2003

    Cite this