Atomic-resolution EELS in aberration-corrected STEM

S. D. Findlay, M. P. Oxley, L. J. Allen, A. R. Lupini, S. J. Pennycook

Research output: Contribution to journal › Meeting Abstract

Original language	English
Pages (from-to)	852-853
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
Publication status	Published - 4 Sept 2003

Cite this

@article{0eee7cf7a0a64cdfb014160e6416fbd0,

title = "Atomic-resolution EELS in aberration-corrected STEM",

author = "Findlay, \{S. D.\} and Oxley, \{M. P.\} and Allen, \{L. J.\} and Lupini, \{A. R.\} and Pennycook, \{S. J.\}",

year = "2003",

month = sep,

day = "4",

language = "English",

volume = "9",

pages = "852--853",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Atomic-resolution EELS in aberration-corrected STEM

AU - Findlay, S. D.

AU - Oxley, M. P.

AU - Allen, L. J.

AU - Lupini, A. R.

AU - Pennycook, S. J.

PY - 2003/9/4

Y1 - 2003/9/4

UR - https://www.scopus.com/pages/publications/0042922823

M3 - Meeting Abstract

AN - SCOPUS:0042922823

SN - 1431-9276

VL - 9

SP - 852

EP - 853

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -