Atomic-resolution EELS in aberration-corrected STEM

S. D. Findlay, M. P. Oxley, L. J. Allen, A. R. Lupini, S. J. Pennycook

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)852-853
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
Publication statusPublished - 4 Sep 2003

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