Atomic force microscopy and direct surface force measurements (IUPAC technical report)

John Ralston, Ian Clair Larson, Mark W Rutland, Adam A Feiler, Mieke Kleijn

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Cite this

@article{f52ceea122b74f359083563aaf99b6d2,

title = "Atomic force microscopy and direct surface force measurements (IUPAC technical report)",

author = "John Ralston and Larson, {Ian Clair} and Rutland, {Mark W} and Feiler, {Adam A} and Mieke Kleijn",

year = "2005",

language = "English",

volume = "77",

pages = "2149 -- 2170",

journal = "Pure and Applied Chemistry",

issn = "0033-4545",

publisher = "Walter de Gruyter",

number = "12",

}

TY - JOUR

T1 - Atomic force microscopy and direct surface force measurements (IUPAC technical report)

AU - Ralston, John

AU - Larson, Ian Clair

AU - Rutland, Mark W

AU - Feiler, Adam A

AU - Kleijn, Mieke

PY - 2005

Y1 - 2005

UR - http://www.iupac.org/publications/pac/

M3 - Article

SN - 0033-4545

VL - 77

SP - 2149

EP - 2170

JO - Pure and Applied Chemistry

JF - Pure and Applied Chemistry

IS - 12

ER -