Atomic force microscopy and direct surface force measurements (IUPAC technical report)

John Ralston, Ian Clair Larson, Mark W Rutland, Adam A Feiler, Mieke Kleijn

Research output: Contribution to journalArticleResearchpeer-review

128 Citations (Scopus)
Original languageEnglish
Pages (from-to)2149 - 2170
Number of pages22
JournalPure and Applied Chemistry
Volume77
Issue number12
Publication statusPublished - 2005

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