Atomic force microscopy and direct surface force measurements (IUPAC technical report)

John Ralston, Ian Clair Larson, Mark W Rutland, Adam A Feiler, Mieke Kleijn

Research output: Contribution to journalArticleResearchpeer-review

122 Citations (Scopus)
Original languageEnglish
Pages (from-to)2149 - 2170
Number of pages22
JournalPure and Applied Chemistry
Volume77
Issue number12
Publication statusPublished - 2005

Cite this

Ralston, J., Larson, I. C., Rutland, M. W., Feiler, A. A., & Kleijn, M. (2005). Atomic force microscopy and direct surface force measurements (IUPAC technical report). Pure and Applied Chemistry, 77(12), 2149 - 2170.
Ralston, John ; Larson, Ian Clair ; Rutland, Mark W ; Feiler, Adam A ; Kleijn, Mieke. / Atomic force microscopy and direct surface force measurements (IUPAC technical report). In: Pure and Applied Chemistry. 2005 ; Vol. 77, No. 12. pp. 2149 - 2170.
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Ralston, J, Larson, IC, Rutland, MW, Feiler, AA & Kleijn, M 2005, 'Atomic force microscopy and direct surface force measurements (IUPAC technical report)', Pure and Applied Chemistry, vol. 77, no. 12, pp. 2149 - 2170.

Atomic force microscopy and direct surface force measurements (IUPAC technical report). / Ralston, John; Larson, Ian Clair; Rutland, Mark W; Feiler, Adam A; Kleijn, Mieke.

In: Pure and Applied Chemistry, Vol. 77, No. 12, 2005, p. 2149 - 2170.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Atomic force microscopy and direct surface force measurements (IUPAC technical report)

AU - Ralston, John

AU - Larson, Ian Clair

AU - Rutland, Mark W

AU - Feiler, Adam A

AU - Kleijn, Mieke

PY - 2005

Y1 - 2005

UR - http://www.iupac.org/publications/pac/

M3 - Article

VL - 77

SP - 2149

EP - 2170

JO - Pure and Applied Chemistry

JF - Pure and Applied Chemistry

SN - 0033-4545

IS - 12

ER -