Architectural test coverage for component-based integration testing

Nor Laily Hashim; Sitalakshmi Ramakrishnan; Heinz W Schmidt

Architectural test coverage for component-based integration testing

Nor Laily Hashim
, Sitalakshmi Ramakrishnan
, Heinz W Schmidt

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the Seventh International Conference on Quality Software
Editors	Aditya Mathur, W Eric Wong, M F Lau
Place of Publication	Los Alamitos CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	262 - 267
Number of pages	6
ISBN (Print)	0769530354
Publication status	Published - 2007
Event	International Conference on Quality Software, 2007 - Portland Oregon USA, Los Alamitos CA USA Duration: 1 Jan 2007 → …

Conference

Conference	International Conference on Quality Software, 2007
City	Los Alamitos CA USA
Period	1/01/07 → …

Cite this

@inproceedings{8c878536e88042f698e3d78d64e542fd,

title = "Architectural test coverage for component-based integration testing",

author = "Hashim, \{Nor Laily\} and Sitalakshmi Ramakrishnan and Schmidt, \{Heinz W\}",

year = "2007",

language = "English",

isbn = "0769530354",

pages = "262 -- 267",

editor = "Aditya Mathur and Wong, \{W Eric\} and Lau, \{M F\}",

booktitle = "Proceedings of the Seventh International Conference on Quality Software",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "International Conference on Quality Software, 2007 ; Conference date: 01-01-2007",

}

Hashim, NL, Ramakrishnan, S & Schmidt, HW 2007, Architectural test coverage for component-based integration testing. in A Mathur, WE Wong & MF Lau (eds), Proceedings of the Seventh International Conference on Quality Software. IEEE, Institute of Electrical and Electronics Engineers, Los Alamitos CA USA, pp. 262 - 267, International Conference on Quality Software, 2007, Los Alamitos CA USA, 1/01/07.

Architectural test coverage for component-based integration testing. / Hashim, Nor Laily; Ramakrishnan, Sitalakshmi; Schmidt, Heinz W.
Proceedings of the Seventh International Conference on Quality Software. ed. / Aditya Mathur; W Eric Wong; M F Lau. Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2007. p. 262 - 267.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Architectural test coverage for component-based integration testing

AU - Hashim, Nor Laily

AU - Ramakrishnan, Sitalakshmi

AU - Schmidt, Heinz W

PY - 2007

Y1 - 2007

UR - http://ieeexplore.ieee.org.ezproxy.lib.monash.edu.au/iel5/4385458/4385459/04385505.pdf?tp=&arnumber=4385505&isnumber=4385459

M3 - Conference Paper

SN - 0769530354

SP - 262

EP - 267

BT - Proceedings of the Seventh International Conference on Quality Software

A2 - Mathur, Aditya

A2 - Wong, W Eric

A2 - Lau, M F

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Los Alamitos CA USA

T2 - International Conference on Quality Software, 2007

Y2 - 1 January 2007

ER -

Architectural test coverage for component-based integration testing

Conference

Other files and links

Cite this