Applying a combination of laboratory X-Ray diffraction and digital image correlation for recording uniaxial stress-strain curves in thin surface layers

A. D. Smith, J. Warren, G. Harrison, M. S. Blackmur, S. Morse, K. Wilford, M. Preuss

Research output: Contribution to journalArticleResearchpeer-review


By combining laboratory-based x-ray diffraction stress analysis with optical digital image correlation recorded in-situ during tensile loading, a new methodology has been developed to obtain for surface specific stress-strain curves. This novel methodology has been validated by comparing the reconstructed stress-strain curves from the x-ray diffraction/optical digital image correlation approach with stress-strain curves recorded using standard methods. The validated methodology enables now the recording of standard mechanical test data of altered surface layers, such as shot peened and machined surfaces or from proton-irradiated samples where the irradiated layer is limited to a depth of 10 s of microns.

Original languageEnglish
Article number105731
Number of pages7
JournalInternational Journal of Mechanical Sciences
Publication statusPublished - 1 Oct 2020
Externally publishedYes


  • Diffraction stress measurement
  • Digital image correlation
  • In-situ mechanical testing
  • SA508 Grade 4-N steel
  • Surface stress-strain curves

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