The statistical theory of X‐ray diffraction and a mosaic crystal model are used to calculate the reflection and transmission factors for a row of pyrolytic graphite plates (echelon‐monochromator). Experimental angular dependencies of reflection and transmission factors are compared with theoretical results. The data of reflection and transmission factors for both CuKα‐ and CuKβ‐lines depending on thickness of plates are given. The thickness of graphite plates for which the efficiency of the echelon‐monochromator is optimal is determined.
|Number of pages
|Physica Status Solidi (A) - Applied Research
|Published - 2000