Application of the statistical dynamical theory of X-Ray diffraction to calculation of the HOPG echelon-monochromator parameters

Yakov Nesterets, Vasily I Punegov, I V Pirshin, A G Touryanski, Alexander V Vinogradov, E Forster, Sergey Podorov

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    The statistical theory of X‐ray diffraction and a mosaic crystal model are used to calculate the reflection and transmission factors for a row of pyrolytic graphite plates (echelon‐monochromator). Experimental angular dependencies of reflection and transmission factors are compared with theoretical results. The data of reflection and transmission factors for both CuKα‐ and CuKβ‐lines depending on thickness of plates are given. The thickness of graphite plates for which the efficiency of the echelon‐monochromator is optimal is determined.
    Original languageEnglish
    Pages (from-to)311-317
    Number of pages7
    JournalPhysica Status Solidi (A) - Applied Research
    Issue number2
    Publication statusPublished - 2000

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