Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge

Andrei Yu Nikulin; Karen Siu; John R Davis; P Zaumseil; A Yu Souvorov; A Freund

doi:10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge

Andrei Yu Nikulin, Karen Siu, John R Davis, P Zaumseil, A Yu Souvorov, A Freund

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	145 - 155
Number of pages	11
Journal	Physica Status Solidi (A) - Applied Research
Volume	184
Issue number	1
DOIs	https://doi.org/10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y
Publication status	Published - 2001

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10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

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Nikulin, A. Y., Siu, K., Davis, J. R., Zaumseil, P., Souvorov, A. Y., & Freund, A. (2001). Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge. Physica Status Solidi (A) - Applied Research, 184(1), 145 - 155. https://doi.org/10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

@article{6fed61f591104c359f850fe2651d8423,

title = "Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge",

author = "Nikulin, \{Andrei Yu\} and Karen Siu and Davis, \{John R\} and P Zaumseil and Souvorov, \{A Yu\} and A Freund",

year = "2001",

doi = "10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y",

language = "English",

volume = "184",

pages = "145 -- 155",

journal = "Physica Status Solidi (A) - Applied Research",

issn = "0031-8965",

publisher = "Wiley-Blackwell",

number = "1",

}

Nikulin, AY, Siu, K, Davis, JR, Zaumseil, P, Souvorov, AY & Freund, A 2001, 'Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge', Physica Status Solidi (A) - Applied Research, vol. 184, no. 1, pp. 145 - 155. https://doi.org/10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

TY - JOUR

T1 - Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge

AU - Nikulin, Andrei Yu

AU - Siu, Karen

AU - Davis, John R

AU - Zaumseil, P

AU - Souvorov, A Yu

AU - Freund, A

PY - 2001

Y1 - 2001

UR - https://www.scopus.com/pages/publications/0035277551

U2 - 10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

DO - 10.1002/1521-396X(200103)184:1<145::AID-PSSA145>3.0.CO;2-Y

M3 - Article

SN - 0031-8965

VL - 184

SP - 145

EP - 155

JO - Physica Status Solidi (A) - Applied Research

JF - Physica Status Solidi (A) - Applied Research

IS - 1

ER -

Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge

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