Application of the Phase-Retrieval X-ray Diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge

Andrei Yu Nikulin, Karen Siu, John R Davis, P Zaumseil, A Yu Souvorov, A Freund

    Research output: Contribution to journalArticleResearchpeer-review

    6 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)145 - 155
    Number of pages11
    JournalPhysica Status Solidi A-Applications and Materials Science
    Volume184
    Issue number1
    DOIs
    Publication statusPublished - 2001

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