Abstract
In this chapter, applications of atomic-resolution STEM to nanomaterials and biological specimens are described. Annular dark field (ADF) imaging is particularly attractive in that it produces an image contrast scaling strongly with atomic number (Z) and which, not being overly sensitive to either specimen thickness or to lens aberrations, is often amenable to direct and visual interpretation. Moreover, STEM allows for the recording of multiple types of signal simultaneously. The range of fields to which STEM is being applied continues to expand, and we cannot possibly do justice to the many applications of STEM to materials analysis in a single chapter. We will, however, endeavor to give a flavor of what is possible by reviewing some highlights in the field of nanomaterials and biological science.
| Original language | English |
|---|---|
| Title of host publication | Scanning Transmission Electron Microscopy of Nanomaterials |
| Subtitle of host publication | Basics of Imaging and Analysis |
| Editors | Nobuo Tanaka |
| Place of Publication | London UK |
| Publisher | Imperial College Press |
| Pages | 109-175 |
| Number of pages | 67 |
| ISBN (Electronic) | 9781848167902, 9781783264711 |
| ISBN (Print) | 9781848167896 |
| DOIs | |
| Publication status | Published - 30 Oct 2014 |