Application of Statistical X-ray Diffraction Theory for Study of Multilayer Systems

Konstantin Mikhailovitch Pavlov, Vasily I Punegov, L Kirste, N Herres, Yoshikazu Takeda, Masao Tabuchi, Michael John Morgan, Stephen Thomas Mudie, James Hester

    Research output: Contribution to journalArticleResearchpeer-review

    Original languageEnglish
    Pages (from-to)650 - 654
    Number of pages5
    JournalBulletin of the Russian Academy of Sciences: Physics
    Volume68
    Issue number4
    Publication statusPublished - 2004

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