Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, A Yu Souvorov, Y Nishino, Barrington Charles Muddle, T Ishikawa

Research output: Contribution to journalArticleResearchpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)100 - 108
Number of pages9
JournalOptics Communications
Issue number1-3
Publication statusPublished - 2005

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