Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials

Aliaksandr V Darahanau; Andrei Yurievich Nikulin; A Yu Souvorov; Y Nishino; Barrington Charles Muddle; T Ishikawa

doi:10.1016/j.optcom.2005.02.071

Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, A Yu Souvorov, Y Nishino, Barrington Charles Muddle, T Ishikawa

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Original language	English
Pages (from-to)	100 - 108
Number of pages	9
Journal	Optics Communications
Volume	251
Issue number	1-3
DOIs	https://doi.org/10.1016/j.optcom.2005.02.071
Publication status	Published - 2005

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10.1016/j.optcom.2005.02.071

Cite this

@article{11e438c218b046fc9c8b00b7515bfd1a,

title = "Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials",

author = "Darahanau, {Aliaksandr V} and Nikulin, {Andrei Yurievich} and Souvorov, {A Yu} and Y Nishino and Muddle, {Barrington Charles} and T Ishikawa",

year = "2005",

doi = "10.1016/j.optcom.2005.02.071",

language = "English",

volume = "251",

pages = "100 -- 108",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier",

number = "1-3",

}

TY - JOUR

T1 - Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials

AU - Darahanau, Aliaksandr V

AU - Nikulin, Andrei Yurievich

AU - Souvorov, A Yu

AU - Nishino, Y

AU - Muddle, Barrington Charles

AU - Ishikawa, T

PY - 2005

Y1 - 2005

U2 - 10.1016/j.optcom.2005.02.071

DO - 10.1016/j.optcom.2005.02.071

M3 - Article

VL - 251

SP - 100

EP - 108

JO - Optics Communications

JF - Optics Communications

SN - 0030-4018

IS - 1-3

ER -