Anisotropic resonant X-ray diffraction of a conjugated polymer at the sulfur K-Edge

Guillaume Freychet, Eliot Gann, Mikhail Zhernenkov, Christopher R. McNeill

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)

Abstract

The planar, aromatic nature of the backbone of conjugated polymers endows them with anisotropic properties. Here we show that the resonant X-ray diffraction of a sulfur-containing semicrystalline conjugated polymer at the sulfur K-edge is highly anisotropic, with strong modulation of diffracted intensity depending upon the relative orientation of the polarization of the incident beam with respect to the diffracting crystal planes. Through determination of the anisotropic resonant scattering factors, we can spectroscopically reproduce the observed resonant anisotropic scattering effects based on a proposed unit cell geometry for the polymer.

Original languageEnglish
Pages (from-to)3762-3766
Number of pages5
JournalJournal of Physical Chemistry Letters
Volume12
Issue number15
DOIs
Publication statusPublished - 12 Apr 2021

Cite this