Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables

Ye Chow Kuang, Melanie Po-Leen Ooi, Arvind Rajan

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA)
    EditorsA H M Zahirul Alam
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages1 - 5
    Number of pages5
    ISBN (Print)9781479908424
    DOIs
    Publication statusPublished - 2013
    EventIEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Kuala Lumpur Malaysia, USA
    Duration: 1 Jan 2013 → …

    Conference

    ConferenceIEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA)
    CityUSA
    Period1/01/13 → …

    Cite this

    Kuang, Y. C., Ooi, M. P-L., & Rajan, A. (2013). Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables. In A. H. M. Zahirul Alam (Ed.), Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) (pp. 1 - 5). USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICSIMA.2013.6717958
    Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Rajan, Arvind. / Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables. Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA). editor / A H M Zahirul Alam. USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. pp. 1 - 5
    @inproceedings{8f5c88faf4f140758a03434a884b90b0,
    title = "Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables",
    author = "Kuang, {Ye Chow} and Ooi, {Melanie Po-Leen} and Arvind Rajan",
    year = "2013",
    doi = "10.1109/ICSIMA.2013.6717958",
    language = "English",
    isbn = "9781479908424",
    pages = "1 -- 5",
    editor = "{Zahirul Alam}, {A H M}",
    booktitle = "Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA)",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
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    Kuang, YC, Ooi, MP-L & Rajan, A 2013, Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables. in AHM Zahirul Alam (ed.), Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA). IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1 - 5, IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA), USA, 1/01/13. https://doi.org/10.1109/ICSIMA.2013.6717958

    Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables. / Kuang, Ye Chow; Ooi, Melanie Po-Leen; Rajan, Arvind.

    Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA). ed. / A H M Zahirul Alam. USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. p. 1 - 5.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

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    T1 - Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables

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    AU - Ooi, Melanie Po-Leen

    AU - Rajan, Arvind

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    U2 - 10.1109/ICSIMA.2013.6717958

    DO - 10.1109/ICSIMA.2013.6717958

    M3 - Conference Paper

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    BT - Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA)

    A2 - Zahirul Alam, A H M

    PB - IEEE, Institute of Electrical and Electronics Engineers

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    Kuang YC, Ooi MP-L, Rajan A. Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables. In Zahirul Alam AHM, editor, Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA). USA: IEEE, Institute of Electrical and Electronics Engineers. 2013. p. 1 - 5 https://doi.org/10.1109/ICSIMA.2013.6717958