Analysis of noise-induced errors in vector-field electron tomography

Zachary Kemp, Timothy Petersen, David Paganin, Kathryn Margery Spiers, Matthew Weyland, Michael John Morgan

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1 - 12
Number of pages12
JournalPhysical Review A
Volume90
Issue number2
DOIs
Publication statusPublished - 2014

Cite this

Kemp, Zachary ; Petersen, Timothy ; Paganin, David ; Spiers, Kathryn Margery ; Weyland, Matthew ; Morgan, Michael John. / Analysis of noise-induced errors in vector-field electron tomography. In: Physical Review A. 2014 ; Vol. 90, No. 2. pp. 1 - 12.
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doi = "10.1103/PhysRevA.90.023859",
language = "English",
volume = "90",
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journal = "Physical Review A",
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Analysis of noise-induced errors in vector-field electron tomography. / Kemp, Zachary; Petersen, Timothy; Paganin, David; Spiers, Kathryn Margery; Weyland, Matthew; Morgan, Michael John.

In: Physical Review A, Vol. 90, No. 2, 2014, p. 1 - 12.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Analysis of noise-induced errors in vector-field electron tomography

AU - Kemp, Zachary

AU - Petersen, Timothy

AU - Paganin, David

AU - Spiers, Kathryn Margery

AU - Weyland, Matthew

AU - Morgan, Michael John

PY - 2014

Y1 - 2014

U2 - 10.1103/PhysRevA.90.023859

DO - 10.1103/PhysRevA.90.023859

M3 - Article

VL - 90

SP - 1

EP - 12

JO - Physical Review A

JF - Physical Review A

SN - 2469-9926

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