Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory

Stephen Thomas Mudie; Konstantin Mikhailovitch Pavlov; Michael J Morgan; Yoshikazu Takeda; M Tabuchi; James Hester

Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory

Stephen Thomas Mudie, Konstantin Mikhailovitch Pavlov, Michael J Morgan, Yoshikazu Takeda, M Tabuchi, James Hester

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
Editors	Michael Gal
Place of Publication	Piscataway USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	111 - 116
Number of pages	6
Publication status	Published - 2002
Event	Conference on Optoelectronic and Microelectronic Materials and Devices 2002 - The University of New South Wales, Sydney, Australia Duration: 11 Dec 2002 → 13 Dec 2002 https://ieeexplore.ieee.org/xpl/conhome/8750/proceeding (Proceedings)

Conference

Conference	Conference on Optoelectronic and Microelectronic Materials and Devices 2002
Abbreviated title	COMMAD 2002
Country/Territory	Australia
City	Sydney
Period	11/12/02 → 13/12/02
Internet address	https://ieeexplore.ieee.org/xpl/conhome/8750/proceeding (Proceedings)

Cite this

Mudie, Stephen Thomas ; Pavlov, Konstantin Mikhailovitch ; Morgan, Michael J et al. / Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory. 2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. editor / Michael Gal. Piscataway USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. pp. 111 - 116

@inproceedings{4fc191e61e3c4f2685888dabea74c112,

title = "Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory",

author = "Mudie, {Stephen Thomas} and Pavlov, {Konstantin Mikhailovitch} and Morgan, {Michael J} and Yoshikazu Takeda and M Tabuchi and James Hester",

year = "2002",

language = "English",

pages = "111 -- 116",

editor = "Michael Gal",

booktitle = "2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Conference on Optoelectronic and Microelectronic Materials and Devices 2002, COMMAD 2002 ; Conference date: 11-12-2002 Through 13-12-2002",

url = "https://ieeexplore.ieee.org/xpl/conhome/8750/proceeding",

}

Mudie, ST, Pavlov, KM, Morgan, MJ, Takeda, Y, Tabuchi, M & Hester, J 2002, Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory. in M Gal (ed.), 2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. IEEE, Institute of Electrical and Electronics Engineers, Piscataway USA, pp. 111 - 116, Conference on Optoelectronic and Microelectronic Materials and Devices 2002, Sydney, New South Wales, Australia, 11/12/02.

Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory. / Mudie, Stephen Thomas; Pavlov, Konstantin Mikhailovitch; Morgan, Michael J et al.
2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. ed. / Michael Gal. Piscataway USA: IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 111 - 116.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory

AU - Mudie, Stephen Thomas

AU - Pavlov, Konstantin Mikhailovitch

AU - Morgan, Michael J

AU - Takeda, Yoshikazu

AU - Tabuchi, M

AU - Hester, James

PY - 2002

Y1 - 2002

M3 - Conference Paper

SP - 111

EP - 116

BT - 2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings

A2 - Gal, Michael

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway USA

T2 - Conference on Optoelectronic and Microelectronic Materials and Devices 2002

Y2 - 11 December 2002 through 13 December 2002

ER -