Analysis of GaN/AIN Buffer layers grown on sapphire substrates via statistical diffraction theory

Stephen Thomas Mudie, Konstantin Mikhailovitch Pavlov, Michael J Morgan, Yoshikazu Takeda, M Tabuchi, James Hester

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publication2002 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
    EditorsMichael Gal
    Place of PublicationPiscataway USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages111 - 116
    Number of pages6
    Publication statusPublished - 2002
    EventConference on Optoelectronic and Microelectronic Materials and Devices 2002 - The University of New South Wales, Sydney, Australia
    Duration: 11 Dec 200213 Dec 2002
    https://ieeexplore.ieee.org/xpl/conhome/8750/proceeding (Proceedings)

    Conference

    ConferenceConference on Optoelectronic and Microelectronic Materials and Devices 2002
    Abbreviated titleCOMMAD 2002
    CountryAustralia
    CitySydney
    Period11/12/0213/12/02
    Internet address

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