An SEM-based X-ray microtomography system

P. R. Miller, S. C. Mayo, T. Gureyev, S. W. Wilkins, J. Sheffield-Parker

Research output: Contribution to journalArticleOtherpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1592-1593
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2006
Externally publishedYes

Cite this

Miller, P. R., Mayo, S. C., Gureyev, T., Wilkins, S. W., & Sheffield-Parker, J. (2006). An SEM-based X-ray microtomography system. Microscopy and Microanalysis, 12(SUPPL. 2), 1592-1593. https://doi.org/10.1017/S1431927606067420