An SEM-based X-ray microtomography system

P. R. Miller, S. C. Mayo, T. Gureyev, S. W. Wilkins, J. Sheffield-Parker

Research output: Contribution to journalMeeting Abstractpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1592-1593
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2006
Externally publishedYes

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