An optimization model for multi-state weighted k-out-of-n system reliability value

Hadi Akbarzadeh Khorshidi, Indra Gunawan, Mahrous Yousef Ibrahim

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society
    EditorsGerhard Zucker, Andres Melendez Augusto Nogueiras
    Place of PublicationPiscataway NJ USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages4357 - 4361
    Number of pages5
    ISBN (Print)9781479902248
    DOIs
    Publication statusPublished - 2013
    EventAnnual Conference of the IEEE Industrial Electronics Society 2013 - Vienna, Austria
    Duration: 10 Nov 201314 Nov 2013
    Conference number: 39th

    Conference

    ConferenceAnnual Conference of the IEEE Industrial Electronics Society 2013
    Abbreviated titleIECON 2013
    CountryAustria
    CityVienna
    Period10/11/1314/11/13

    Cite this

    Akbarzadeh Khorshidi, H., Gunawan, I., & Ibrahim, M. Y. (2013). An optimization model for multi-state weighted k-out-of-n system reliability value. In G. Zucker, & A. M. A. Nogueiras (Eds.), Proceedings IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society (pp. 4357 - 4361). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IECON.2013.6699836