An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS

Anna Richelli, Simon Kennedy, Jean-Michel Redoute

Research output: Contribution to journalArticleResearchpeer-review

Abstract

This letter presents an on-chip common-mode cancelation circuit (CMCC), which increases the immunity to electromagnetic interference (EMI) of the input stage in a classic CMOS operational amplifier. Two test chips, containing a classic Miller amplifier and a Miller amplifier with CMCC, respectively, have been fabricated in the UMC 180 nm CMOS process. Measurements illustrate how the latter amplifier exhibits an increased immunity to EMI compared with the former.

Original languageEnglish
Pages (from-to)2049-2051
Number of pages3
JournalIEEE Transactions on Electromagnetic Compatibility
Volume59
Issue number6
DOIs
Publication statusPublished - 1 Dec 2017

Cite this

Richelli, Anna ; Kennedy, Simon ; Redoute, Jean-Michel. / An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS. In: IEEE Transactions on Electromagnetic Compatibility. 2017 ; Vol. 59, No. 6. pp. 2049-2051.
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An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS. / Richelli, Anna; Kennedy, Simon; Redoute, Jean-Michel.

In: IEEE Transactions on Electromagnetic Compatibility, Vol. 59, No. 6, 01.12.2017, p. 2049-2051.

Research output: Contribution to journalArticleResearchpeer-review

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