An application of phase retrieval x-ray diffractometry to refraction/small-angle scattering data

Karen Siu, Andrei Yu Nikulin, Kenji Tamasaku, T Ishikawa

    Research output: Contribution to journalArticleResearchpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Pages (from-to)2912 - 2917
    Number of pages6
    JournalJournal of Physics D: Applied Physics
    Volume34
    Issue number18
    DOIs
    Publication statusPublished - 2001

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