An analysis of failure-based test profiles for random testing

Robert Merkel; Fei-Ching Kuo; Tsong Chen

doi:10.1109/COMPSAC.2011.88

An analysis of failure-based test profiles for random testing

Robert Merkel, Fei-Ching Kuo, Tsong Chen

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference
Editors	Sheikh Iqbal Ahamed, Wolfgang Minker, Zhi Jin
Place of Publication	Los Alamitos CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	68 - 75
Number of pages	8
ISBN (Print)	9780769544397
DOIs	https://doi.org/10.1109/COMPSAC.2011.88
Publication status	Published - 2011
Event	International Computer Software and Applications Conference 2011 - Munich, Germany Duration: 18 Jul 2011 → 21 Jul 2011 Conference number: 35th https://ieeexplore.ieee.org/xpl/conhome/6032120/proceeding (Proceedings)

Conference

Conference	International Computer Software and Applications Conference 2011
Abbreviated title	COMPSAC 2011
Country/Territory	Germany
City	Munich
Period	18/07/11 → 21/07/11
Other	COMPSAC 2011 - The Computed World: Software Beyond the Digital Society
Internet address	https://ieeexplore.ieee.org/xpl/conhome/6032120/proceeding (Proceedings)

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10.1109/COMPSAC.2011.88

Cite this

@inproceedings{c23c6d4cd1244e089b9b94e2fb5e9f24,

title = "An analysis of failure-based test profiles for random testing",

author = "Robert Merkel and Fei-Ching Kuo and Tsong Chen",

year = "2011",

doi = "10.1109/COMPSAC.2011.88",

language = "English",

isbn = "9780769544397",

pages = "68 -- 75",

editor = "Ahamed, \{Sheikh Iqbal\} and Wolfgang Minker and Zhi Jin",

booktitle = "Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "International Computer Software and Applications Conference 2011, COMPSAC 2011 ; Conference date: 18-07-2011 Through 21-07-2011",

url = "https://ieeexplore.ieee.org/xpl/conhome/6032120/proceeding",

}

Merkel, R, Kuo, F-C & Chen, T 2011, An analysis of failure-based test profiles for random testing. in SI Ahamed, W Minker & Z Jin (eds), Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference. IEEE, Institute of Electrical and Electronics Engineers, Los Alamitos CA USA, pp. 68 - 75, International Computer Software and Applications Conference 2011, Munich, Bavaria, Germany, 18/07/11. https://doi.org/10.1109/COMPSAC.2011.88

An analysis of failure-based test profiles for random testing. / Merkel, Robert; Kuo, Fei-Ching; Chen, Tsong.
Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference. ed. / Sheikh Iqbal Ahamed; Wolfgang Minker; Zhi Jin. Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2011. p. 68 - 75.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - An analysis of failure-based test profiles for random testing

AU - Merkel, Robert

AU - Kuo, Fei-Ching

AU - Chen, Tsong

N1 - Conference code: 35th

PY - 2011

Y1 - 2011

UR - http://dx.doi.org/10.1109/COMPSAC.2011.88

U2 - 10.1109/COMPSAC.2011.88

DO - 10.1109/COMPSAC.2011.88

M3 - Conference Paper

SN - 9780769544397

SP - 68

EP - 75

BT - Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference

A2 - Ahamed, Sheikh Iqbal

A2 - Minker, Wolfgang

A2 - Jin, Zhi

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Los Alamitos CA USA

T2 - International Computer Software and Applications Conference 2011

Y2 - 18 July 2011 through 21 July 2011

ER -

An analysis of failure-based test profiles for random testing

Conference

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