An analysis of failure-based test profiles for random testing

Robert Merkel, Fei-Ching Kuo, Tsong Chen

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 35th Annual IEEE International Computer Software and Applications Conference
    EditorsSheikh Iqbal Ahamed, Wolfgang Minker, Zhi Jin
    Place of PublicationLos Alamitos CA USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages68 - 75
    Number of pages8
    ISBN (Print)9780769544397
    DOIs
    Publication statusPublished - 2011
    EventInternational Computer Software and Applications Conference 2011 - Munich, Germany
    Duration: 18 Jul 201121 Jul 2011
    Conference number: 35th
    https://ieeexplore.ieee.org/xpl/conhome/6032120/proceeding (Proceedings)

    Conference

    ConferenceInternational Computer Software and Applications Conference 2011
    Abbreviated titleCOMPSAC 2011
    CountryGermany
    CityMunich
    Period18/07/1121/07/11
    OtherCOMPSAC 2011 - The Computed World: Software Beyond the Digital Society
    Internet address

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