Accounting for Brownian forces in nano-particle sorting

Tuck Wah Ng, Adrian Neild, Winston Ming Shen Yii, Pascal Heeraman

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

Optical methods offer little handling damage in nano-particle sorting; which is useful in nanoscale lithography. We describe some strategies that make use of or overcome Brownian forces in order to achieve effective sorting and discuss the usefulness of tracking to evaluate sorting effectiveness.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics Pacific Rim (CLEO/PR 2009)
Subtitle of host publicationShanghai, China, 30 August – 3 September 2009
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages2
ISBN (Print)9781424438303, 9781424438297
DOIs
Publication statusPublished - 2009
EventConference on Lasers and Electro-Optics Pacific Rim 2009 - Shanghai, China
Duration: 30 Aug 20093 Sep 2009
Conference number: 8th
https://ieeexplore.ieee.org/xpl/conhome/5238710/proceeding (Proceedings)

Conference

ConferenceConference on Lasers and Electro-Optics Pacific Rim 2009
Abbreviated titleCLEO-PR 2009
CountryChina
CityShanghai
Period30/08/093/09/09
OtherCLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics
Internet address

Keywords

  • Brownian
  • Optical sorting

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