Abstract
The effects of the capillary stresses during the drying of p+ -type porous silicon (PS) layers are reported. The cracking of the PS layers occurs for samples thicker than a critical thickness value hc. Taking into account the elastic properties of p + -type PS material, a simple model shows that hc varies as (1 - p)3 and 1/γ2LV, where p is the porosity and γLV is the surface tension of the drying liquid. A good agreement with experimental results is observed. This study leads also to a very easy and simple method which increases the hc value by a factor of about 25 when using pentane as the drying liquid (instead of water).
Original language | English |
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Pages (from-to) | 219-222 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 276 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 15 Apr 1996 |
Externally published | Yes |
Keywords
- Elastic properties
- Growth mechanism
- Silicon
- Stress