@inproceedings{52b69d0fb1a34afeb8412e955d127286,
title = "A unique technique for reducing the effects of hot-carrier induced degradations in CMOS bistable circuits for fault tolerant VLSI design",
author = "Das, {Arran Gazeril Manmohan}",
year = "2013",
doi = "10.1109/TAEECE.2013.6557294",
language = "English",
isbn = "9781467356138",
pages = "323 -- 328",
editor = "Salman, {Mohammad S} and Bucak, {Ihsan Omur}",
booktitle = "TAEECE2013 Proceedings",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
address = "United States of America",
note = "International Conference on Technological Advances in Electrical, Electronics and Computer Engineering 2013, TAEECE 2013 ; Conference date: 09-05-2013 Through 11-05-2013",
}