A tale of two metrics: Simultaneous bounds on competitiveness and regret

Lachlan Leicester Henry Andrew, John Douceur (Editor), Siddharth Barman, Jun (Jim) Xu (Editor), Katrina Ligett, Minghong Lin, Adam Meyerson, Alan Roytman, Adam Wierman

Research output: Contribution to conferenceAbstract

4 Citations (Scopus)
Original languageEnglish
Pages329 - 330
Number of pages2
DOIs
Publication statusPublished - 2013
Externally publishedYes
EventACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2013 - Carnegie Mellon University, Pittsburgh, United States of America
Duration: 17 Jun 201321 Jun 2013
https://www.sigmetrics.org/sigmetrics2013/ (Conference website)
https://dl.acm.org/citation.cfm?id=2465529 (Conference Proceedings (ACM Digital Library))

Conference

ConferenceACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2013
Abbreviated titleSIGMETRICS 2013
CountryUnited States of America
CityPittsburgh
Period17/06/1321/06/13
Internet address

Cite this

Andrew, L. L. H., Douceur, J. (Ed.), Barman, S., Xu, J. J. (Ed.), Ligett, K., Lin, M., Meyerson, A., Roytman, A., & Wierman, A. (2013). A tale of two metrics: Simultaneous bounds on competitiveness and regret. 329 - 330. Abstract from ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2013, Pittsburgh, United States of America. https://doi.org/10.1145/2494232.2465533