Abstract
In this paper, a novel stability robustness test for systems with linear time-varying uncertainties is introduced. The advantages of the stability robustness test lie in the fact that it can cope with multi-input multi-output, stable, or unstable systems whose linear time-varying uncertainties can be represented by a standard structured uncertainty model, and that the implementation of the test is straightforward. The tool used to provide the means of determining system stability robustness is the linear time-invariant v-gap metric.
Original language | English |
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Title of host publication | Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 3651-3656 |
Number of pages | 6 |
ISBN (Print) | 0780395689, 9780780395688 |
DOIs | |
Publication status | Published - 2005 |
Externally published | Yes |
Event | IEEE Conference of Decision and Control (CDC)/European Control Conference (ECC) 2005 - Seville, Spain Duration: 12 Dec 2005 → 15 Dec 2005 Conference number: 44th |
Conference
Conference | IEEE Conference of Decision and Control (CDC)/European Control Conference (ECC) 2005 |
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Abbreviated title | CDC/ECC 2005 |
Country/Territory | Spain |
City | Seville |
Period | 12/12/05 → 15/12/05 |