A stability robustness test for systems with linear time-varying uncertainties

Wynita M. Griggs, Alexander Lanzon, Brian D.O. Anderson

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

1 Citation (Scopus)

Abstract

In this paper, a novel stability robustness test for systems with linear time-varying uncertainties is introduced. The advantages of the stability robustness test lie in the fact that it can cope with multi-input multi-output, stable, or unstable systems whose linear time-varying uncertainties can be represented by a standard structured uncertainty model, and that the implementation of the test is straightforward. The tool used to provide the means of determining system stability robustness is the linear time-invariant v-gap metric.

Original languageEnglish
Title of host publicationProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages3651-3656
Number of pages6
ISBN (Print)0780395689, 9780780395688
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventIEEE Conference of Decision and Control (CDC)/European Control Conference (ECC) 2005 - Seville, Spain
Duration: 12 Dec 200515 Dec 2005
Conference number: 44th

Publication series

NameProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Volume2005

Conference

ConferenceIEEE Conference of Decision and Control (CDC)/European Control Conference (ECC) 2005
Abbreviated titleCDC/ECC 2005
CountrySpain
CitySeville
Period12/12/0515/12/05

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