A probabilistic context-aware approach for quality of experience measurement in pervasive systems

Karan Mitra, Arkady Zaslavsky, Christer Ahlund

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 2011 ACM Symposium on Applied Computing
Editors	Dongwan Shin
Place of Publication	New York NY USA
Publisher	Association for Computing Machinery (ACM)
Pages	419 - 424
Number of pages	6
ISBN (Print)	9781450301138
Publication status	Published - 2011
Event	ACM Symposium on Applied Computing 2011 - Tunghai University, Taichung, Taiwan Duration: 21 Mar 2011 → 24 Mar 2011 Conference number: 26th http://www.sigapp.org/sac/sac2011/ https://dl.acm.org/doi/proceedings/10.1145/1982185 (Proceedings)

Conference	ACM Symposium on Applied Computing 2011
Abbreviated title	SAC 2011
Country/Territory	Taiwan
City	Taichung
Period	21/03/11 → 24/03/11
Internet address	http://www.sigapp.org/sac/sac2011/ https://dl.acm.org/doi/proceedings/10.1145/1982185 (Proceedings)

Cite this

@inproceedings{d7aecf0bf8374523b55296a4a46c51d2,

title = "A probabilistic context-aware approach for quality of experience measurement in pervasive systems",

author = "Karan Mitra and Arkady Zaslavsky and Christer Ahlund",

year = "2011",

language = "English",

isbn = "9781450301138",

pages = "419 -- 424",

editor = "Dongwan Shin",

booktitle = "Proceedings of the 2011 ACM Symposium on Applied Computing",

publisher = "Association for Computing Machinery (ACM)",

address = "United States of America",

note = "ACM Symposium on Applied Computing 2011, SAC 2011 ; Conference date: 21-03-2011 Through 24-03-2011",

url = "http://www.sigapp.org/sac/sac2011/, https://dl.acm.org/doi/proceedings/10.1145/1982185",

}

A probabilistic context-aware approach for quality of experience measurement in pervasive systems. / Mitra, Karan; Zaslavsky, Arkady; Ahlund, Christer.
Proceedings of the 2011 ACM Symposium on Applied Computing. ed. / Dongwan Shin. New York NY USA: Association for Computing Machinery (ACM), 2011. p. 419 - 424.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - A probabilistic context-aware approach for quality of experience measurement in pervasive systems

AU - Mitra, Karan

AU - Zaslavsky, Arkady

AU - Ahlund, Christer

N1 - Conference code: 26th

PY - 2011

Y1 - 2011

M3 - Conference Paper

SN - 9781450301138

SP - 419

EP - 424

BT - Proceedings of the 2011 ACM Symposium on Applied Computing

A2 - Shin, Dongwan

PB - Association for Computing Machinery (ACM)

CY - New York NY USA

T2 - ACM Symposium on Applied Computing 2011

Y2 - 21 March 2011 through 24 March 2011

ER -