A phenomenological description for chemically induced grain boundary migration

Y. J.M. Brechet, G. R. Purdy

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)


The phenomenology of chemically induced grain boundary migration (CIGM) is described in a model which allows the computation of the speed of the moving grain boundary, and of the diffusion field, in a self-consistent way. Special emphasis is given to the problem of a threshold for migration, and to the question of the shape of the moving grain boundary.

Original languageEnglish
Pages (from-to)2253-2259
Number of pages7
JournalActa Metallurgica
Issue number8
Publication statusPublished - Aug 1989
Externally publishedYes

Cite this